Engineering Professor, retired, and
Semiconductor Industry Consultant, self employed, semi - retired
Home Address
Peter Gwozdz
21865 Regnart Road
Cupertino CA 95014
(408) 446-2579
Dr. Peter S. Gwozdz is a technologist in the field of semiconductor wafer fabrication. He has been continuously active in “Silicon Valley” since 1973. Gwozdz has been a part time industry consultant since 1988.
In the College of Engineering at San Jose State University (SJSU), 1988 - 2003, Professor Gwozdz taught courses part time in the field of Integrated Circuit (IC) Processing, in the departments of General Engineering, Materials Engineering, and Electrical Engineering.
Also at SJSU, Gwozdz was the Director of the Center for Electronic Materials and Devices. Peter developed and managed the IC Labs through the Center.
In addition, Dr. Gwozdz held more than 100 sessions of a three day laboratory short course on microfabrication in the IC Labs at SJSU. The short course was attended by industry professionals from all over the world. SEMI also sponsored a version of this short course, taught by Gwozdz, at the SEMICON conventions held in San Francisco, San Jose, Austin, Boston, Munich, and Singapore. Gwozdz also did this course in-house for industry companies. Participants received Gwozdz’s course materials, “Semiconductor Processing Technology”, both in notebook format and in CD Power Point format. The course was also available from SemiZone.com, 2002 - 2009, in streaming web format.
Before joining SJSU in September, 1988, Gwozdz spent fifteen years in the local "Silicon Valley" semiconductor industry, including eight years at Advanced Micro Devices, where he was a Director of technology development.
Peter's Ph.D. in Physics, from the University of Illinois, was on defects in Silicon, 1973.
Pete's hobby is Polish genealogy.
Expert Witness, Technical Consultation. Semiconductor Processing for IC.
Semiconductor Processing Technology. At SJSU, at SEMI Conventions, at companies, on the web.
Director, Center for Electronic Materials and Devices.
Developed and managed the Integrated Circuits Laboratories.
Professor. Materials Engineering.
Directed Fab 9, a pilot line wafer fab for next generation high speed logic technology.
MS & PhD in Physics, thesis topic - defects in silicon.
The Y–DNA of the alleged Copernicus remains is haplogroup R1b1b2a1
pages 127-157 of “The Nicolaus Copernicus grave mystery”, Polish Academy of
Arts and Sciences, Edited by Michał Kokowski,
Krakow, 22-23 February 2010. Online
Link
Y-STR Mountains in Haplospace
Journal of Genetic Genealogy 5(2), 127-185 (2009)
Semiconductor Processing Technology
Book for use in a 3 day short course.
416 pages. Available in
electronic and notebook format.
Continuously updated 1994 - 2008.
NSF Microfabrication Laboratory Workshops
Peter S. Gwozdz. IEEE Transactions on Education 39, 211 (1996)
Semiconductor Manufacturing Education at San Jose State University
Peter S. Gwozdz. IEEE Transactions on Semiconductor Manufacturing 5, 153
(1992)
Semiconductor Manufacturing Education at San Jose State University
Peter S. Gwozdz. ISMSS 91 Proceedings, IEEE Service Center, Piscataway,
N.J. This is an invited paper that was presented at the Third International
Semiconductor Manufacturing Science Symposium (ISMSS), which was held in
conjunction with SEMICON WEST, the semiconductor annual trade show. The paper
was also published in the IEEE Transactions on Semiconductor Manufacturing,
above.
Yield Modeling on Your Personal Computer
Peter S. Gwozdz. Semiconductor International, p. 98, August, 1990
Denser Process Gets the Most out of Bipolar VLSI
Phil Downing, Pete Gwozdz, Bernie New. Electronics, June 28, 1984, p. 131
Also translated into the following journals:
Elettronica Domani 6/85, p.
93. Italian
Der Elektroniker Nr 1/1985,
p. 75. German
New Electronics, 19 February 1985. British
Aluminum Intrusions or "Rat Bites"
Peter S. Gwozdz and H.M. Bath
1983 Electrochem Soc
Meeting, San Francisco, CA. Extended Abstracts, p.682.
Positive vs Negative: a Photoresist Analysis
Peter S. Gwozdz. 1981 SPIE Meeting, San Jose, Develop. in Semic. Microlith. 275, 156 (1981)
Empirical Statistics for Yield Map Analysis
P.S. Gwozdz, 1978 SPIE Meeting, San Jose, Develop. in Semicond.
Microlith. 135, 160 (1978)
An Analysis of Diffusion Process Control
P.S. Gwozdz, Solid State Technology, p. 71 (November 1977)
Electron Irradiation of Gold Below 2 K
P.S. Gwozdz & J.S. Koehler, Phys Rev B8, 3616 (1973)
Electron Irradiation and Annealing of Gold
P.S. Gwozdz & J.S. Koehler, Bull Amer Phys Soc 18, 479 (1973)
Changes in A-C Conductivity of Silicon with Electron Irradiation at 0.5
K.
P.S. Gwozdz & J.S. Koehler, Phys Rev B6, 4571, (1972)
Changes in A-C Conductivity of Silicon with Electron Irradiation at 0.5
K.
P.S. Gwozdz & J.S. Koehler, Bull Amer Phys Soc 17, 307 (1972)
A Simple Ion Source for Implantation Doping of Semiconductors
P.S. Gwozdz & J.S. Koehler Rev Sci Instr 41, 1677 (1970)
The Effect of Surface Treatment on Resonant Raman Scattering in CdS
P.J. Colwell, P.S. Gwozdz, & M.V. Klein. Tenth International Conf. on
the Physics of Semiconductors, Cambridge, Mass. Aug 1970
High Conductivity Cu-Implanted CdS
P.S. Gwozdz & J.S. Koehler, Bull Amer Phys Soc 15, 397 (1970)
Hot Electron Effect in GaAs
R. Crandall & P.S. Gwozdz, Bull Amer Phys Soc 13, 407 (1968)
Method for Interconnecting Metallic Layers
Peter S. Gwozdz
US Patent # 4,451,326. Issued May 29, 1984
Process for dual and 3-layer aluminum interconnect. I developed this process
for the 29116 microcontroler. I later extended this
process for the 29300 family. This process has since been extended to all AMD
IMOX Bipolar multilayer interconnect, manufactured in San Antonio, Texas.
Method of Making Integrated Bipolar Semiconductor Device By First Forming
Junction Isolation Regions and Recessed Oxide Isolation Regions Without Birds
Beak
Peter S. Gwozdz, Christopher Schmidt, Bill Price
US Patent # 4,622,738. Issued November 18, 1986
This is the patent on the device structure for the transistor used in the 29300
series of chips. 1.5 micron recessed isolation bipolar ECL.
Method for Interconnecting Conducting Layers of an Integrated Circuit
Peter S. Gwozdz and Hubert Bath
US Patent # 4,605,470. Issued August 12, 1986
Process for interlayer dielectric up to 5 microns thick.
Method for Filling a Trench in an Integrated Circuit Structure Without
Producing Voids
Peter S. Gwozdz
US Patent # 4,714,520. Issued December 22, 1987
Process for filling isolation trenches, or slots.
Passivation For Integrated Circuit Structures
Bert L. Allen, Peter S. Gwozdz and Thomas R. Bowers
US Patent # 5,010,024. Issued April 23, 1991
Passivation for One Time Programmable ROMS, providing a low stress, ultraviolet
transparent film.
8/88 - 1/03: Director of the Center for Electronic Materials and Devices. Developed the Integrated Circuits Laboratories (IC Labs) and managed the IC Labs for 14 years. Developed, produced and instructed a laboratory short course for industry professionals. Provided the NSF Microfabrication Laboratory Workshop, a series of one week workshops for undergraduate faculty, sponsored by the National Science Foundation, on IC laboratory education. Directed and coordinated more than 100 research and development projects with industry and government agencies. Professor, teaching courses in the field of Integrated Circuit (IC) Processing, in the departments of General Engineering, Materials Engineering, and Electrical Engineering. Advisor for Masters Thesis’s.
12/87 - 8/88: Operations Manager for Wafer Foundry.
4/86 - 11/87: Member of the Technical Staff.
11/83 - 3/86: Director of Bipolar Logic Technology. Directed Fab 9.
1/80 - 10/83: Process Engineering & Technology Development Manager for Fab 9.
Worked for three different companies. In all 3 cases, successfully started up a new technology in production.
2/79 - 12/79: AMI, Santa Clara, CA. VMOS subfab for Epi & CVD.
11/77 - 2/79: Fairchild Semiconductor, Mt. View, CA. IIIL for the 9440. High speed microprocessor.
5/76 - 11/77: Raytheon Semiconductor, Mt. View, CA. 2901 high speed microprocessor family.
Sustaining Process Engineer, manufacturing, Linear.
Manager of Yield Improvement, Bipolar Memory.
RCA Labs; 1967 and 1968 summers; GaAs.
Sprague Labs; 1966 summer; Tungsten CVD on Silicon.
2018: TSMC, Haynes and Boone
2014: Spansion, Ropes & Gray
2013: LSI Logic, Thompson & Knight
2012: uPI, Haynes & Boone, LSI Logic, Thompson & Knight
2011: Crane, Brooks, Intellectual Ventures, Weil Gotshal & Manges
2010: AMD, O’Melveny & Meyers, uPI, Covington & Burling, Freescale, Jones Day
2009: LSI Logic, Thompson & Knight, Sidley Austin
2008: Infineon, Baker Botts, BIAX, Williams Morgan & Amerson, Monitor, On Semiconductor, Jones Day, SMIC, Paul Hastings Janofsky & Walker
1993 to 2008: SEMI: Provide short course “Semiconductor Processing Technology”, an introduction for professionals in the semiconductor industry. More than 60 sessions were provided, at the SEMICON conventions held in San Francisco, San Jose, Austin, Boston, Munich, Singapore, Geneva, and other cities.
1993 to 2007: Provided short course “Semiconductor Processing Technology” in-house at companies world-wide. More than 40 sessions were provided, at more than 35 companies.
2007: Spiricon, Matsushita, McDermott Will Emery, Applied Materials, Weil Gotshal Manges, Goodwin Procter, Powerchip, Venable
2006: Spiricon, Matsushita, McDermott Will Emery, Applied Materials, Weil Gotshal Manges, Goodwin Procter, Monitor
2005: Helix, SMIC, Paul Hastings Janofsky & Walker, Micrel, O’Melveny & Meyers, Sidley Austin
2004: ZF Micro Solutions, BOC Edwards, RHEM (Rodel), ST Microelectronics, Thompson & Knight, California Micro, Tinicum, Royal Insurance, Helms Mulliss Wicker, Agere, Kirkland & Ellis
2003: GE Betz; Northurp Grumman, ST Microelectronics; Jenkins & Gilchrist, Shape Products
2002: Silicon Integrated Systems Corporation (SiS); Thelen Reid & Priest LLP; Wilson Sonsini Goodrich & Rosati; Andrews & Kurth; Munger, Tolles & Olson
2001: IXYS; Townsend, Townsend & Crew LLP; Microelectronics and Computer Technology Corporation (MCC)
2000: PRI Automation; Lam Research; Mitsubishi Texas Ultra Pure Air; Soros Fund Management; Gerson Lehrman Group
1999: Alexandria VA US District Court; Ericsson; MATEC Maricopa; Schlumberger
1998: Atmel; CTI Cryogenics; Hitachi; Hypervision; MPIi; PRI Automation; Rodel; Samsung; Senior Flexonics
Expert Witness
Technical Consultation
Technical Training
Technical Documentation
Patent Review
Research and Development
Library research
Wafer Foundry Management
Wafer Foundry Search & Evaluation
Technology Management
Semiconductor Processing
Multilevel Interconnect
Planarization
CMP - Chemical Mechanical Planarization
Chemical Vapor Deposition
Plasma Enhanced Chemical Vapor Deposition
Semiconductor Contamination Control
Defects in Oxide
Defects in Silicon
Microcontamination
Plasma Etching
Photolithography
Power Transistors
Semiconductor Devices
Transistors